Patent Assignment
Reel/Frame 023849/0581
Assignment of Assignor's Interest
Recorded: 2010-01-26
Pages: 4
Assignors
SUZUKI, HIDEKAZU
Executed: 2009-12-04
FUJII, TOSHIAKI
Executed: 2009-12-07
HASSEL-SHEARER, MIKE
Executed: 2009-12-10
Assignees
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
SII NANOTECHNOLOGY USA INC.
19865 NORDHOFF STREET, NORTHRIDGE, CALIFORNIA, 91324
Covered Property
(1)
Cross Section Processing Method and Method of Manufacturing Cross Section Observation Sample
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Sep 23, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033858/0577 →
Change of Name
Sep 30, 2014
From: SII NANOTECHNOLOGY USA INC.
To: HITACHI HIGH-TECHNOLOGIES SCIENCE AMERICA, INC.
Reel/Frame 033868/0183 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →