Patent Assignment
Reel/Frame 033858/0577
Change of Name
Recorded: 2014-09-23
Pages: 21
Assignor
SII NANOTECHNOLOGY INC.
Executed: 2013-01-01
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property
(1)
Cross Section Processing Method and Method of Manufacturing Cross Section Observation Sample
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jan 26, 2010
From: SUZUKI, HIDEKAZU; FUJII, TOSHIAKI; HASSEL-SHEARER, MIKE
To: SII NANOTECHNOLOGY INC.; SII NANOTECHNOLOGY USA INC.
Reel/Frame 023849/0581 →
Change of Name
Sep 30, 2014
From: SII NANOTECHNOLOGY USA INC.
To: HITACHI HIGH-TECHNOLOGIES SCIENCE AMERICA, INC.
Reel/Frame 033868/0183 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →