Assignment of Assignor's Interest

Recorded: 2010-02-16 Pages: 3

Assignor

FUJII, KUNINOBU

Executed: 2010-01-28

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Semiconductor Integrated Circuit, Method of Testing Semiconductor Integrated Circuit, and Method of Designing Semiconductor Integrated Circuit

Application: 12/700,925 →

Publication: US 2010/0205493

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.