Assignment of Assignor's Interest

Recorded: 2010-02-24 Pages: 3

Assignor

WENZ, HOLGER

Executed: 2009-12-16

Assignee

NANOPHOTONICS AG

GALILEO-GALILEI-STR. 28, 55129 MAINZ, GERMANY

Covered Property (1)

Inspection Device and Inspection Method for the Optical Examination of Object Surfaces, Particularly of Wafer Surfaces

Patent: 8,289,509 →

Application: 12/657,744 →

Publication: US 2010/0195097

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.