IP Library Assignment 024068/0665
Patent Assignment
Reel/Frame 024068/0665

Assignment of Assignor's Interest

Recorded: 2010-03-04 Pages: 3
Assignors
FUCHIGAMI, HIROYUKI
Executed: 2010-02-24
SATOU, SHOUICHIROU
Executed: 2010-02-24
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Continuity Testing Apparatus and Continuity Testing Method Including Open/Short Detection Circuit
Patent: 8,310,246 →
Application: 12/659,342 →
Publication: US 2010/0225331
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025193/0001 →