Patent Assignment
Reel/Frame 025193/0001
Change of Name
Recorded: 2010-10-26
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Processor system and operation mode switching method for processor system
Display panel driver, display device, and method of operating the same
Application:
12/656,028 →
Publication:
US 2010/0182302
Display Apparatus and Driver
Display driver circuit and display apparatus using the same
Application:
12/656,155 →
Publication:
US 2010/0188383
Nonvolatile Memory Having Plurality of Memory Blocks Each Including Data Storage Area and Discrimination Area
Semiconductor device including metal insulator semiconductor transistor
Application:
12/656,261 →
Publication:
US 2010/0187590
Comparator Circuit
Clock extraction circuit
Application:
12/656,401 →
Publication:
US 2010/0201417
Semiconductor Device Having Cmos Transfer Circuit and Clamp Element
Comparator Circuit
Memory controller and memory control method
Application:
12/656,482 →
Publication:
US 2010/0205386
Semiconductor device having electro-static discharge protection element
Application:
12/656,483 →
Publication:
US 2010/0193869
Analog-To-Digital Converter
Power supply control apparatus including overcurrent detection circuit
Application:
12/656,522 →
Publication:
US 2010/0207605
Power Supply Control Apparatus Including Overcurrent Detection Circuit
Semiconductor integrated circuit device and method of manufacturing the same
Application:
12/656,557 →
Publication:
US 2010/0213520
Manufacturing apparatus for semiconductor device, controlling method for the manufacturing apparatus, and storage medium storing control program for the manufacturing apparatus
Application:
12/656,560 →
Publication:
US 2010/0211207
Antenna switch and radio communication device
Application:
12/656,561 →
Publication:
US 2010/0227571
Usb Host Controller and Controlling Method for Usb Host Controller
Semiconductor Integrated Circuit Including a Power Controllable Region
Semiconductor Storage Device Including a Lever Shift Unit That Shifts Level of Potential of Bit Line Pair
Information processing apparatus and error detection method
Application:
12/656,598 →
Publication:
US 2010/0229077
Display Device Drive Circuit
Semiconductor Device and Defect Analysis Method for a Semiconductor Device
Method of Stacking Semiconductor Chips Including Forming an Interconnect Member and a Through Electrode
Semiconductor Integrated Circuit
Semiconductor Integrated Circuit Device
Failure analysis method, apparatus, and program for semiconductor integrated circuit
Probe card, semiconductor testing device including the same, and fuse checking method for probe card
Application:
12/656,726 →
Publication:
US 2010/0225343
Watchdog timer and control method therefor
Semiconductor Device and Method of Manufacturing Semiconductor Device Including Wiring via and Switch via for Connecting First and Second Wirings
Status Holding Circuit and Status Holding Method
Semiconductor Device Test Circuit, Semiconductor Device, and Its Manufacturing Method
Method of Manufacturing a Semiconductor Device
USB interface apparatus and USB packet transmitting/receiving method
Application:
12/659,210 →
Publication:
US 2010/0228993
Semiconductor Device and Input Selection Control Method
Buffer Circuit Having Switch Circuit Capable of Outputing Two and More Different High Voltage Potentials
Magnetoresistive Element, Magnetic Random Access Memory and Method of Manufacturing the Same
Circuit design supporting apparatus and circuit design supporting method
Operational Amplifier
Continuity Testing Apparatus and Continuity Testing Method Including Open/Short Detection Circuit
Delta-Sigma a/D Converter
Network Processor, Reception Controller and Data Reception Processing Method Performing Direct Memory Access Transfer
Intermediate Potential Generation Circuit
Method and Apparatus for Analyzing Structure of Complex Material Layer, and Storage Medium Storing Program for Causing a Computer to Execute Thereof Method
Semiconductor integrated circuit and control, method of the same
Application:
12/659,400 →
Publication:
US 2010/0250967
Semiconductor device and method of manufacturing semiconductor device
Application:
12/659,450 →
Publication:
US 2010/0244129
Display panel driver and display apparatus using the same
Semiconductor Device and Method for Manufacturing the Same
Selective Storage of Additional Inversion Data or Edc Data
Semiconductor Device
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Device and Method of Manufacturing the Same
Plasma processing apparatus, fault detection apparatus, and fault detection method
Application:
12/659,989 →
Publication:
US 2010/0262302
Method of Manufacturing Semiconductor Device
Integrated Circuit
Pll Circuit
Current Control Circuit
Cryptographic Processing Apparatus and Method for Storage Medium
Display driver and method of testing the same
Application:
12/662,066 →
Publication:
US 2010/0271406
Disconnection Detecting Circuit and Disconnection Detecting Method by Using Capacitor
Bipolar Transistor Including Conductive First and Second Protection Layers
Semiconductor device and layout method therefor
Application:
12/662,149 →
Publication:
US 2010/0270643
Nitride semiconductor optical element and method of manufacturing the same
Application:
12/662,185 →
Publication:
US 2010/0272142
Mobile Terminal, Mobile Communication System, Base Station Searching Method, and Storage Medium Storing Base Station Searching Program
Method for Forming Resist Pattern and Method for Manufacturing Semiconductor Device
Method of Manufacturing Semiconductor Device
Application:
12/662,200 →
Publication:
US 2010/0255672
Image processing apparatus and image processing method
Application:
12/662,330 →
Publication:
US 2010/0272375
Semiconductor Device and Method of Manufacturing Semiconductor Device
Semiconductor apparatus and manufacturing method of the same
Application:
12/662,332 →
Publication:
US 2010/0308457
Semiconductor Device and Method of Manufacturing Semiconductor Device
Polishing Apparatus and Polishing Method
Semiconductor Integrated Circuit
Driver and display apparatus using the same
Application:
12/662,358 →
Publication:
US 2010/0265234
Semiconductor device and method of operating the same
Application:
12/662,359 →
Publication:
US 2010/0308893
Voltage Regulator Circuit
Drive Circuit, liquid crystal display device, and method for controlling output voltage
Application:
12/662,394 →
Publication:
US 2010/0328357
Semiconductor Device Including an Inductor That Is Inductively Coupled to Another Inductor
Semiconductor Device
Display apparatus using power supply circuit
Application:
12/662,458 →
Publication:
US 2010/0265241
Semiconductor device and data driver of display apparatus using the same
Resistance Variation Detection Circuit, Semiconductor Device and Resistance Variation Detection Method
Power Supply Control Device and Power Supply Control Method
Method for Manufacturing Semiconductor Device, and Semiconductor Device
Mesa Photodiode and Method for Manufacturing the Same
Amplifier circuit with resistive current limitter
Application:
12/662,514 →
Publication:
US 2010/0271132
Semiconductor Device with Lower Layer Wiring
Boost Circuit and Liquid Crystal Display Device Using Boost Circuit
Anti-Fuse Memory Cell and Semiconductor Memory Device
Variable inductor
Power supply voltage control circuit
Application:
12/662,710 →
Publication:
US 2010/0295530
A/D Conversion Circuit and Test Method
Related Assignments
(21)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jan 13, 2010
From: MATSUYAMA, HIDEKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023823/0344 →
Assignment of Assignor's Interest
Jan 20, 2010
From: OBA, KAORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023862/0069 →
Assignment of Assignor's Interest
Jan 22, 2010
From: ISHIGAKI, HIROKAZU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023881/0447 →
Assignment of Assignor's Interest
Jan 26, 2010
From: NAKAHARA, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023903/0025 →
Assignment of Assignor's Interest
Jan 28, 2010
From: WAKAYAMA, YASUSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023925/0039 →
Assignment of Assignor's Interest
Jan 29, 2010
From: TASHIRO, SHINYA; TANIGUCHI, KAZUTAKA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023959/0877 →
Assignment of Assignor's Interest
Jan 29, 2010
From: NAKAHARA, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023952/0151 →
Assignment of Assignor's Interest
Feb 1, 2010
From: HABASAKI, TADAYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023952/0165 →
Assignment of Assignor's Interest
Feb 1, 2010
From: KOYAMA, TETSUHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023953/0161 →
Assignment of Assignor's Interest
Feb 1, 2010
From: YAMASHITA, HARUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023952/0157 →
Assignment of Assignor's Interest
Feb 2, 2010
From: NAKAHARA, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023974/0183 →
Assignment of Assignor's Interest
Feb 2, 2010
From: NAKAHARA, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023974/0218 →
Assignment of Assignor's Interest
Feb 3, 2010
From: KONDO, KUNIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023969/0546 →
Assignment of Assignor's Interest
Feb 3, 2010
From: FURUTA, HIROSHI; SHIRAI, TAKAYUKI; NAGA, SHUNSAKU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023969/0623 →
Assignment of Assignor's Interest
Feb 3, 2010
From: OOTA, HIDEO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023969/0633 →
Assignment of Assignor's Interest
Feb 3, 2010
From: MURAKAMI, TAKASHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023968/0347 →
Assignment of Assignor's Interest
Feb 4, 2010
From: ODA, YASUHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023967/0734 →
Assignment of Assignor's Interest
Mar 10, 2010
From: UEDA, TOSHIAKI; FUJIWARA, AKIRA; OKUTANI, TAMOTSU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024081/0034 →
Assignment of Assignor's Interest
Mar 10, 2010
From: MIYAZAKI, KIYOSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024081/0075 →
Assignment of Assignor's Interest
Apr 6, 2010
From: KOYATA, YASUSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024203/0139 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →