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App. No. 12/656,726 · Confirmation No. 2119

Probe card, semiconductor testing device including the same, and fuse checking method for probe card

Inventor: Takayuki Kouno
Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2012-06-19 ABN Abandonment 2 View
2011-12-12 CTNF Non-Final Rejection 14 View
2011-12-12 892 List of references cited by examiner 1 View
2011-12-12 1449 List of References cited by applicant and considered by examiner 1 View
2011-12-12 SRNT Examiner's search strategy and results 6 View
2011-12-12 SRFW Search information including classification, databases and other search related notes 1 View
2010-09-09 NTC.PUB Notice of Publication 1 View
2010-03-22 PD.FILED.E Priority Documents electronically retrieved by USPTO from a participating IP Office 18 View
2010-03-09 APP.FILE.REC Filing Receipt 3 View
2010-02-16 TRNA Transmittal of New Application 8 View
2010-02-16 SPEC Specification 12 View
2010-02-16 CLM Claims 2 View
2010-02-16 ABST Abstract 1 View
2010-02-16 DRW Drawings-only black and white line drawings 5 View
2010-02-16 OATH Oath or Declaration filed 2 View
2010-02-16 TRAN.LET Transmittal Letter 1 View
2010-02-16 IDS Information Disclosure Statement (IDS) Form (SB08) 1 View
2010-02-16 FOR Foreign Reference 4 View
2010-02-16 WFEE Fee Worksheet (SB06) 1 View
2010-02-16 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
12/656,726
Filed
2010-02-16
Pub. No.
US20100225343A1
Art Unit
2858