Assignment of Assignor's Interest

Recorded: 2010-02-16 Pages: 3

Assignor

KOUNO, TAKAYUKI

Executed: 2010-01-26

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Probe card, semiconductor testing device including the same, and fuse checking method for probe card

Application: 12/656,726 →

Publication: US 2010/0225343

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.