Patent Assignment
Reel/Frame 024112/0574
Assignment of Assignor's Interest
Recorded: 2010-03-19
Pages: 3
Assignors
KAITO, TAKASHI
Executed: 2010-03-12
TASHIRO, JUNICHI
Executed: 2010-03-12
SUGIYAMA, YOAUSHIKO
Executed: 2010-03-12
IWASAKI, KOUJI
Executed: 2010-03-12
FUJII, TOSHIAK
Executed: 2010-03-12
AITA, KAZUO
Executed: 2010-03-12
OGAWA, TAKASHI
Executed: 2010-03-12
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Composite Focused Ion Beam Device, and Processing Observation Method and Processing Method Using the Same
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0543 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072907/0356 →