IP Library › Assignment 024206/0627
Patent Assignment
Reel/Frame 024206/0627

Assignment of Assignor's Interest

Recorded: 2010-04-08 Pages: 5
Assignor
WILBY, ROBERT JOHN
Executed: 2008-09-19
Assignee
METRYX LIMITED
UNIT 2A, MANOR PARK, NAILSEA WALL LANE, NAILSEA, BRISTOL, BS48 4DD, UNITED KINGDOM
Covered Property (1)
Semiconductor Wafer Metrology Apparatus and Method
Patent: 8,683,880 →
Application: 12/680,756 →
Publication: US 2010/0206098
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 11, 2026
From: METRYX LIMITED
To: LAM RESEARCH CORPORATION
Reel/Frame 074040/0493 →