Patent Assignment
Reel/Frame 074040/0493
Assignment of Assignor's Interest
Recorded: 2026-03-11
Pages: 13
Assignor
METRYX LIMITED
Executed: 2026-03-02
Assignee
LAM RESEARCH CORPORATION
4650 CUSHING PARKWAY, FREMONT, CALIFORNIA, 94538
Covered Properties
(11)
Measuring Apparatus
Semiconductor Wafer Metrology Apparatus and Method
Method of Controlling Semiconductor Device Fabrication
Semiconductor Wafer Weight Metrology Apparatus
Method of Controlling Semiconductor Device Fabrication
Semiconductor Wafer Metrology Apparatus and Method
Method and Device for Determining Information Relating to the Mass of a Semiconductor Wafer
Measurement Apparatus and Method
Semiconductor Wafer Processing Methods and Apparatus
Semiconductor Wafer Mass Metrology Apparatus and Semiconductor Wafer Mass Metrology Method
Method and Apparatus for Controlling the Temperature of a Semiconductor Wafer
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 26, 2009
From: WILBY, ROBERT JOHN; KIERMASZ, ADRIAN
To: METRYX LIMITED
Reel/Frame 023422/0010 →
Assignment of Assignor's Interest
Apr 8, 2010
From: WILBY, ROBERT JOHN
To: METRYX LIMITED
Reel/Frame 024206/0627 →
Assignment of Assignor's Interest
Jul 15, 2010
From: KIERMASZ, ADRIAN
To: METRYX LIMITED
Reel/Frame 024691/0612 →
Assignment of Assignor's Interest
Oct 10, 2017
From: WILBY, ROBERT JOHN; KIERMASZ, ADRIAN
To: METRYX LIMITED
Reel/Frame 043820/0256 →
Assignment of Assignor's Interest
Jan 3, 2018
From: WILBY, ROBERT JOHN; KIERMASZ, ADRIAN
To: METRYX LTD.
Reel/Frame 044522/0768 →
Assignment of Assignor's Interest
Nov 23, 2020
From: ELLIOTT, GREGOR; TONNIS, ERIC
To: METRYX LIMITED
Reel/Frame 054444/0164 →
Assignment of Assignor's Interest
Jan 9, 2026
From: ELLIOTT, GREGOR ROBERT; TONNIS, ERIC; HARRISON, PAUL; BERRY, MARK
To: METRYX LIMITED
Reel/Frame 073415/0855 →