Patent Assignment
Reel/Frame 024365/0966
Change of Name
Recorded: 2010-05-11
Pages: 13
Assignor
FUJITSU MICROELECTRONICS LIMITED
Executed: 2010-04-01
Assignee
FUJITSU SEMICONDUCTOR LIMITED
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU,, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Property
(1)
Film Thickness Monitoring Structure for Semiconductor Substrate
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.