IP Library Assignment 024444/0244
Patent Assignment
Reel/Frame 024444/0244

Assignment of Assignor's Interest

Recorded: 2010-05-26 Pages: 2
Assignors
KAMIYA, MAMORU
Executed: 2010-03-31
HAZAKA, YOSHINORI
Executed: 2010-03-31
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Semiconductor Device and Abnormality Detecting Method
Application: 12/787,812 →
Publication: US 2010/0306602
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025191/0985 →