Patent Assignment
Reel/Frame 025191/0985
Change of Name
Recorded: 2010-10-26
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Method of Manufacturing a Semiconductor Device
Method of Manufacturing a Semiconductor Device
Light Receiving Circuit and Photocoupler Isolation Circuit
Optical Transmitter and Method of Manufacturing the Same
Application:
12/760,040 →
Publication:
US 2010/0266241
Method of Fabricating Semiconductor Device
Difference Image Generation Device, Difference Image Generation Method, and Computer Readable Media
Semiconductor Storage Device and Method of Manufacturing Same
Semiconductor Device
Semiconductor Device and Manufacturing Method of the Same
Interpolating a/D Converter
Amplifier with Bias Stabilizer
Semiconductor Integrated Circuit and Testing Method for the Same
Application:
12/764,445 →
Publication:
US 2010/0275076
Processor and Method of Controlling Instruction Issue in Processor
Application:
12/765,563 →
Publication:
US 2010/0274995
Flip-Flop Circuit and Prescaler Circuit Including the Same
Semiconductor Device and Semiconductor Device Measuring System
Orthogonality Compensating Device, Radio Receiving Device, Orthogonality Compensating Method, and Non-Transitory Computer Readable Medium
Application:
12/766,572 →
Publication:
US 2010/0297973
Fifo Serial Control Device, Semicondicutor Device, and Serial Data Transfer Method That Indicates Inclusion or Non-Inclusion of End Data of Serial Data
Orthogonality Compensating Device, Radio Receiving Device, Orthogonality Compensating Method, and Non-Transitory Computer Readable Medium
Application:
12/766,634 →
Publication:
US 2010/0297974
Layout Design Method, Layout Design Program, and Layout Design Apparatus
Application:
12/767,186 →
Publication:
US 2010/0281452
Method of Manufacturing Optical Receiver Module and Apparatus for Manufacturing the Same
Application:
12/767,225 →
Publication:
US 2010/0302543
Interrupt Processing Apparatus and Method
Application:
12/768,081 →
Publication:
US 2010/0299470
Light Receiving Circuit
Semiconductor Memory Integrated Device with a Precharge Circuit Having Thin-Film Transistors Gated by a Voltage Higher Than a Power Supply Voltage
Optical Communication Module and Method of Manufacturing the Same
Application:
12/769,347 →
Publication:
US 2010/0316338
Field-Effect Transistor
Semiconductor Device
Input Overvoltage Protection Circuit with Soft-Start Function
Semiconductor Apparatus and Temperature Detection Circuit
Charge Transfer Device
Delay Circuit
Application:
12/772,667 →
Publication:
US 2010/0295593
Semiconductor Chip and Semiconductor Device Including the Same
Word Line Selection Circuit and Row Decoder
Semiconductor Device Having Silicon-Diffused Metal Wiring Layer and Its Manufacturing Method
Pll Circuit and Optical Disc Apparatus
Test Method, Test Control Program and Semiconductor Device
Application:
12/774,002 →
Publication:
US 2010/0332932
Termination Resistance Adjusting Circuit
Semiconductor Apparatus
Memory Checking System and Method
Application:
12/774,864 →
Publication:
US 2010/0287426
Semiconductor Device
Application:
12/775,115 →
Publication:
US 2010/0320570
Analog-Digital Converter Circuit and Analog-Digital Conversion Method
Application:
12/776,467 →
Publication:
US 2010/0289684
Booster Circuit
Bus Arbitration Circuit and Bus Arbitration Method
Application:
12/778,204 →
Publication:
US 2010/0318706
Clock Distribution Circuit and Layout Design Method Using Same
Equalizer Adjustment Method and Adaptive Equalizer
Application:
12/779,324 →
Publication:
US 2010/0329327
Drive Circuit
Application:
12/779,386 →
Publication:
US 2010/0315130
Sram and Method for Accessing Sram
Circuit, Apparatus, and Method for Signal Transfer
Lead Frame, and Electronic Part Using the Same
Application:
12/783,857 →
Publication:
US 2011/0001226
Display Apparatus and Method of Testing the Same
Application:
12/783,879 →
Publication:
US 2011/0001739
Voltage-Controlled Oscillator
Electrical Fuse Circuit and Method of Operating the Same
Application:
12/784,875 →
Publication:
US 2010/0302699
Warp-Suppressed Semiconductor Device
Digital Noise Filter
Semiconductor Device and Method for Manufacturing Same
Application:
12/786,871 →
Publication:
US 2010/0301495
Clock Switch Circuit and Clock Switch Method of the Same
Semiconductor Integrated Circuit and Method of Saving and Recovering Internal State Thereof
Application:
12/787,802 →
Publication:
US 2010/0308876
Semiconductor Device and Abnormality Detecting Method
Application:
12/787,812 →
Publication:
US 2010/0306602
Semiconductor Device and Method of Inspecting an Electrical Characteristic of a Semiconductor Device
Application:
12/787,815 →
Publication:
US 2010/0301333
Computer System, Information Protection Method, and Program
Application:
12/788,422 →
Publication:
US 2010/0312978
Signal Processing Apparatus and Signal Processing Method
Semiconductor Memory Device, Memory Test Method and Computer Program for Designing Program of Semiconductor Memory Device
Impedance Adjustment Circuit
Method of Manufacturing Semiconductor Device and Semiconductor Device
Scan Test Circuit, and Method and Program for Designing Same
Radio Communication Apparatus and Offset Correction Method
Arrangement of Power Supply Cells Within Cell-Base Integrated Circuit
Application:
12/789,727 →
Publication:
US 2010/0308667
Dma Transfer Control Device
Semiconductor Device and Abnormality Prediction Method Thereof
Semiconductor Device and Electrostatic Discharge Protection Method for the Semiconductor Device
Application:
12/789,944 →
Publication:
US 2010/0309593
Method of Manufacturing Semiconductor Device
Application:
12/789,957 →
Publication:
US 2010/0311234
Semiconductor Device
Solid-State Imaging Device
Application:
12/791,087 →
Publication:
US 2010/0309358
Nonvolatile Semiconductor Storage Device
Application:
12/791,199 →
Publication:
US 2010/0308392
Analyzing Method of Semiconductor Device, Designing Method Thereof, and Design Supporting Apparatus
Microcomputer and Microcomputer System
Application:
12/791,715 →
Publication:
US 2010/0332874
Information Processing System and Information Processing Method Thereof
Application:
12/795,251 →
Publication:
US 2011/0022823
Probe Card and Test Equipment
Application:
12/796,173 →
Publication:
US 2011/0006797
Signal Line Driving Circuit and Liquid Crystal Display Device
Application:
12/796,314 →
Publication:
US 2011/0018853
Display Control Circuit and Display Control Method
Application:
12/796,734 →
Publication:
US 2011/0004777
Frequency Synthesizer
Semiconductor Chip, Semiconductor Wafer, Method of Manufacturing Semiconductor Chip
Semiconductor Device
Method of manufacturing semiconductor device and semiconductor device
Application:
12/801,097 →
Publication:
US 2010/0327447
Electrostatic discharge protection circuit
Method and Design System for Semiconductor Integrated Circuit
Fault Location Estimation Device, Fault Location Estimation Method, and Program
Spread Spectrum Clock Generator and Semiconductor Device
Semiconductor device
Application:
12/801,206 →
Publication:
US 2010/0320521
Test System and Test Method of Semiconductor Integrated Circuit
Method of manufacturing semiconductor device
Semiconductor Device
Testing method for a semiconductor integrated circuit device, semiconductor integrated circuit device and testing system
Application:
12/801,210 →
Publication:
US 2010/0315116
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 12, 2010
From: FURUYA, AKIRA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024219/0057 →
Assignment of Assignor's Interest
Apr 13, 2010
From: ONO, MASATAKA; FUJITA, AKIKO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024223/0669 →
Assignment of Assignor's Interest
Apr 13, 2010
From: MOURI, YUUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024226/0403 →
Assignment of Assignor's Interest
Apr 14, 2010
From: HOSODA, TETSUYA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024231/0610 →
Assignment of Assignor's Interest
Apr 15, 2010
From: SEZAKI, ISAO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024237/0602 →
Assignment of Assignor's Interest
Apr 16, 2010
From: NAKASHIBA, YASUTAKA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024246/0203 →
Assignment of Assignor's Interest
Apr 16, 2010
From: YAMAMOTO, HIDEO; TAKEHARA, KEI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024246/0809 →
Assignment of Assignor's Interest
Apr 16, 2010
From: TAKESHITA, TOSHIAKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024248/0179 →
Assignment of Assignor's Interest
Apr 19, 2010
From: FUJIHARA, AKIRA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024254/0142 →
Assignment of Assignor's Interest
Apr 20, 2010
From: NAKAJIMA, YUJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024258/0884 →
Assignment of Assignor's Interest
Apr 22, 2010
From: MATSUYAMA, HIDEKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024274/0981 →
Assignment of Assignor's Interest
Apr 23, 2010
From: MAEHARA, MASAKAZU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024281/0754 →
Assignment of Assignor's Interest
Apr 23, 2010
From: CHEN, JIA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024282/0575 →
Assignment of Assignor's Interest
Apr 26, 2010
From: NAKAYAMA, SANCHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024288/0978 →
Assignment of Assignor's Interest
Apr 26, 2010
From: YAMAMOTO, YUJI; YOKOYAMA, RYOUICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024289/0111 →
Assignment of Assignor's Interest
Apr 26, 2010
From: YAMAMOTO, YUJI; YOKOYAMA, RYOUICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024289/0208 →
Assignment of Assignor's Interest
May 13, 2010
From: YUASA, TACHIO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024381/0519 →
Assignment of Assignor's Interest
Jul 2, 2010
From: TAMEGAYA, YUKIO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024631/0066 →
Assignment of Assignor's Interest
Jul 8, 2010
From: TOKUMARU, ATSUSHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024650/0972 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →