IP Library Granted Patent US 7,993,952
Granted Patent B2
US 7,993,952 · App. 12/772,666 · Granted Aug 9, 2011

Charge transfer device

Assignee: Renesas Electronics Corporation
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Quick Facts
Patent No.
US 7,993,952
App. No.
12/772,666
Granted
Aug 9, 2011
Kind
B2
Abstract

A charge transfer device 1 has an P-type region, an N-type well provided to the surficial portion of the P-type region, and transfer electrodes having P-type conductivity, provided over the N-type substrate while placing an insulating film in between.

Claims (12)

1. A method of making a charge transfer device which comprises a P-type region, an N-type well formed in the P-type region, and transfer electrodes provided over the N-type well while placing an insulating film in between, each of the transfer electrodes including a storage electrode and a barrier electrode, the storage electrode being provided as a P-type polysilicon that is formed on the insulating film, comprising:

examining a potential difference between a potential of the N-type well under the storage electrode being provided as an N-type polysilicon and a potential of the N-type well under the storage electrode being provided as a P-type polysilicon on condition that the N-type well has a first impurity concentration and the same potential is applied to the N-type polysilicon and the P-type polysilicon; and

setting an impurity concentration of the N-type well to a second impurity concentration so that a potential of the N-type well having the second impurity concentration under the storage electrode being provided as the P-type polysilicon is substantially equal to the potential of the N-type well having the first concentration under the storage electrode being provided as the N-type polysilicon.

2. The method of making a charge transfer device as claimed in claim 1 , wherein the storage electrode and the barrier electrode included in one transfer electrode are formed from a single polysilicon layer.

3. The method of making a charge transfer device as claimed in claim 1 , wherein the storage electrode and the barrier electrode included in one transfer electrode are joined to each other.

4. The method of making a charge transfer device as claimed in claim 1 , wherein the storage electrode further comprises a conductive material that includes metal formed on the P-type polysilicon.

5. The method of making a charge transfer device as claimed in claim 1 , wherein the barrier electrode is provided as a P-type polysilicon.

6. The method of making a charge transfer device as claimed in claim 1 , wherein the barrier electrode is provided as an N-type polysilicon.

7. The method of making a charge transfer device as claimed in claim 1 , wherein the barrier electrode is provided as a polysilicon and a conductive material that includes metal formed thereon.

8. The method of making a charge transfer device as claimed in claim 1 , further comprising:

an N-type diffusion region formed in an upper portion in the N-type well which is provided under the barrier electrode, N-type diffusion region having

a third impurity concentration lower than the second impurity concentration.

Assignments (2)
CHANGE OF NAME Recorded Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025191/0985 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 3, 2010
From: MATSUYAMA, EIJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024325/0746 →
Priority Claims (1)
JP 2007-091330 · Mar 30, 2007 · national
Continuity (2)
Continuation 12058939 · Mar 31, 2008
Related Publication 20100210044A1 · Aug 19, 2010