IP Library Assignment 024501/0711
Patent Assignment
Reel/Frame 024501/0711

Assignment of Assignor's Interest

Recorded: 2010-06-08 Pages: 2
Assignors
NIYAMA, KEITAROU
Executed: 2010-03-31
SAKANO, NORIYUKI
Executed: 2010-03-31
TAKAHASHI, YUUKI
Executed: 2010-03-31
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Scan Test Circuit, and Method and Program for Designing Same
Patent: 8,402,329 →
Application: 12/789,594 →
Publication: US 2010/0318862
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025191/0985 →