IP Library Assignment 024524/0579
Patent Assignment
Reel/Frame 024524/0579

Assignment of Assignor's Interest

Recorded: 2010-06-11 Pages: 5
Assignors
ZETTLER, JOERG THOMAS
Executed: 2010-05-07
SCHENK, TOBIAS
Executed: 2010-05-07
UREDAT, STEFFEN
Executed: 2010-05-07
ZILIAN, JENS
Executed: 2010-05-07
HENNINGER, BERND
Executed: 2010-05-07
BINETTI, MARCELLO
Executed: 2010-05-07
HABERLAND, KOLJA
Executed: 2010-05-07
Assignee
LAYTEC GMBH
SEESENER STR. 10-13, BERLIN, 10709, GERMANY
Covered Property (1)
Method for Calibrating a Pyrometer, Method for Determining the Temperature of a Semiconducting Wafer and System for Determining the Temperature of a Semiconducting Wafer
Patent: 8,388,219 →
Application: 12/777,661 →
Publication: US 2010/0290500
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 12, 2012
From: LAYTEC GMBH
To: LAYTEC AKTIENGESELLSCHAFT
Reel/Frame 027521/0513 →