Patent Assignment
Reel/Frame 027521/0513
Change of Name
Recorded: 2012-01-12
Pages: 3
Assignor
LAYTEC GMBH
Executed: 2010-10-01
Assignee
LAYTEC AKTIENGESELLSCHAFT
SEESENER STR. 10-13, BERLIN, 10709, GERMANY
Covered Properties
(4)
Method for Calibrating a Pyrometer, Method for Determining the Temperature of a Semiconducting Wafer and System for Determining the Temperature of a Semiconducting Wafer
Method and Apparatus for Determining the Layer Thickness and the Refractive Index of a Sample
Pyrometer Adapted for Detecting Uv-Radiation and Use Thereof
Method and apparatus for real-time determination of curvature and azimuthal asymmetry of a surface
Related Assignments
(4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 11, 2010
From: ZETTLER, JOERG THOMAS; SCHENK, TOBIAS; UREDAT, STEFFEN; ZILIAN, JENS
To: LAYTEC GMBH
Reel/Frame 024524/0579 →
Assignment of Assignor's Interest
Jun 11, 2010
From: ZETTLER, JOERG-THOMAS; ZETTLER, JOHANNES K
To: LAYTEC GMBH
Reel/Frame 024525/0145 →
Assignment of Assignor's Interest
Aug 18, 2010
From: ZETTLER, JOERG-THOMAS; ZILIAN, JENS; SCHENK, TOBIAS
To: LAYTEC GMBH
Reel/Frame 024855/0850 →
Assignment of Assignor's Interest
Sep 17, 2010
From: ZETTLER, JOERG-THOMAS; SCHENK, TOBIAS
To: LAYTEC GMBH
Reel/Frame 025002/0606 →