IP Library Assignment 024525/0145
Patent Assignment
Reel/Frame 024525/0145

Assignment of Assignor's Interest

Recorded: 2010-06-11 Pages: 3
Assignors
ZETTLER, JOERG-THOMAS
Executed: 2010-05-07
ZETTLER, JOHANNES K
Executed: 2010-05-07
Assignee
LAYTEC GMBH
SEESENER STR. 10-13, BERLIN, 10709, GERMANY
Covered Property (1)
Method and Apparatus for Determining the Layer Thickness and the Refractive Index of a Sample
Patent: 8,233,158 →
Application: 12/777,712 →
Publication: US 2010/0290046
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 12, 2012
From: LAYTEC GMBH
To: LAYTEC AKTIENGESELLSCHAFT
Reel/Frame 027521/0513 →