Assignment of Assignor's Interest

Recorded: 2010-06-21 Pages: 2

Assignor

MAKINO, YOSHIAKI

Executed: 2010-03-31

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Method and Device for Testing Semiconductor

Application: 12/818,857 →

Publication: US 2011/0018576

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.