Patent Assignment
Reel/Frame 025191/0916
Change of Name
Recorded: 2010-10-26
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Output Circuit Having Pre-Emphasis Function
Method for Manufacturing a Semiconductor Device, Semiconductor Chip and Semiconductor Wafer
Method for Manufacturing Semiconductor Device, Semiconductor Chip, and Semiconductor Wafer
Level Shift Circuit
Semiconductor device and method of removing semiconductor device noise
Application:
12/801,247 →
Publication:
US 2010/0327964
Semiconductor Device
Differential Amplifier
Communication Device
Method of Manufacturing Semiconductor Device, Semiconductor Device Thus Manufactured, and Semiconductor Manufacturing Apparatus
Pattern Forming Method, Semiconductor Device Manufacturing Method and Phase Shift Photomask Having Dummy Gate Patterns
Mesa Photodiode and Method for Manufacturing the Same
Semiconductor Storage Device and Its Control Method
Optical Disk Device
D/A Converter Including Higher-Order Resistor String
Method and Apparatus for Manufacturing Semiconductor Device
Input Interface Circuit
Information reproducing apparatus using adaptive equalizer and adaptive equalization method
Application:
12/801,583 →
Publication:
US 2011/0002375
Differential Chopper Comparator and a/D Converter Including the Same
Semiconductor Device Capable of Switching Operation Modes
Semiconductor Device
Apparatus, method, and program product for autofocus including a contrast obtaining unit that obtains a focus contrast and a control unit that controls a focus lens according to the focus contrast
Rapid Discharging Circuit Upon Detection of Abnormality
Overvoltage Protection Circuit
Method of Manufacturing Semiconductor Apparatus
Semiconductor device
Application:
12/801,833 →
Publication:
US 2011/0050327
Printed Wiring Board, Semiconductor Device, and Method for Manufacturing Printed Wiring Board
Semiconductor device having process failure detection circuit and semiconductor device production method
Application:
12/801,856 →
Publication:
US 2011/0012108
Semiconductor Device
Method for manufacturing semiconductor device, and semiconductor manufacturing apparatus used in said method
Application:
12/801,858 →
Publication:
US 2011/0014785
Semiconductor Memory Device
Semiconductor Device and Manufacturing Method Thereof
Delay locked loop circuit and signal delay method
Application:
12/801,894 →
Publication:
US 2011/0032014
Tcp-Type Semiconductor Device
Light-Receving Circuit and Semiconductor Device Having Same
Bus Relay Device and Bus Control System Including Bus Masters, Interconnect Section, and Bridge Section
Static random accee memory device
Application:
12/805,115 →
Publication:
US 2010/0277970
Semiconductor device, external connection terminal, method of manufacturing semiconductor device, and method of manufacturing external connection terminal
Application:
12/805,203 →
Publication:
US 2011/0042802
Reference current or voltage generation circuit
Application:
12/805,239 →
Publication:
US 2011/0050197
Push-Pull Amplifier Circuit and Operational Amplifier Circuit Using the Same
Semiconductor Device and Method of Manufacturing Semiconductor Device
Amplifier Circuit and Light Receiving Amplifier Circuit Using the Same
Fault Monitoring Circuit, Semiconductor Integrated Circuit, and Faulty Part Locating Method
Application:
12/816,800 →
Publication:
US 2011/0043323
Semiconductor Memory Device
Image Processing Device and Image Processing Method
Application:
12/817,888 →
Publication:
US 2011/0033120
Semiconductor Integrated Circuit Device
Application:
12/817,914 →
Publication:
US 2010/0252911
Semiconductor Device
Application:
12/818,636 →
Publication:
US 2011/0018096
Method and Device for Testing Semiconductor
Application:
12/818,857 →
Publication:
US 2011/0018576
Semiconductor Device with Complementary Transistors That Include Hafnium-Containing Gate Insulators and Metal Gate Electrodes
Clock Data Recovery Circuit and Display Device
Semiconductor Device and Semiconductor Module Employing Thereof
Semiconductor Device
Test Apparatus of Semiconductor Device and Method Thereof
Multi-Phase Clock Generation Circuit
Application:
12/820,756 →
Publication:
US 2011/0050312
Nonvolatile Semiconductor Memory Device
Power Supply Circuit and Semiconductor Device
Application:
12/821,955 →
Publication:
US 2011/0025279
Differential Amplifier Circuit, Data Line Driver Using the Same, and Liquid Crystal Display Apparatus
Baud Rate Error Detection Circuit and Baud Rate Error Detection Method
Application:
12/822,887 →
Publication:
US 2011/0026572
Semiconductor Device and Process for Producing the Same
Application:
12/823,536 →
Publication:
US 2010/0330799
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Integrated Circuit, and Method for Testing Semiconductor Integrated Circuit
Semiconductor Apparatus and Data Reading Method
Application:
12/823,702 →
Publication:
US 2011/0013466
Data Receiving Device, Data Receiving Method and Program
Application:
12/823,768 →
Publication:
US 2011/0051934
Semiconductor Device
Memory Interface Control Circuit
Method and System for Test Point Insertion
Stream Processor and Task Management Method Thereof
Application:
12/825,868 →
Publication:
US 2011/0029757
Driving Circuit and Driving Method
Application:
12/825,871 →
Publication:
US 2011/0007063
System and Method Generating Object Code
Esd Protection Element
Semiconductor Light Receiving Device
Application:
12/825,946 →
Publication:
US 2011/0024865
Display Panel Driver, Display Apparatus, and Display Panel Driving Method
Application:
12/825,958 →
Publication:
US 2011/0007068
Display Apparatus and Image Displaying Method
Application:
12/825,999 →
Publication:
US 2011/0001754
Semiconductor Device
Semiconductor Device with an Inductor
Reticle and Manufacturing Method of Solid-State Image Sensor
Method of Manufacturing Semiconductor Device and Semiconductor Device
Liquid Crystal Display Driver and Liquid Crystal Display Device
Application:
12/826,121 →
Publication:
US 2011/0007057
Differential Class Ab Amplifier Circuit, Driver Circuit and Display Device
Application:
12/826,154 →
Publication:
US 2011/0007058
Scanning Electron Microscope Control Device, Control Method, and Program
Application:
12/826,181 →
Publication:
US 2011/0024621
Power System Interconnection System and Power Converting Method
Application:
12/826,216 →
Publication:
US 2011/0026283
Design Method, Design Program and Design Support Device for Semiconductor Integrated Circuit, and Semiconductor Integrated Circuit
Semiconductor Device
Application:
12/826,737 →
Publication:
US 2011/0012268
Nonvolatile Semiconductor Memory Device
Information Reproduction Apparatus and Information Reproduction Method
Analog-Digital Converter Circuit and Calibration Method
Application:
12/827,244 →
Publication:
US 2011/0032128
Data Transfer Control Device and Data Transfer Control Method
Application:
12/827,362 →
Publication:
US 2011/0047303
A Resistor String/Switching Type Tree D-a Converter
Application:
12/827,471 →
Publication:
US 2011/0032135
Debugging System, Emulator, and Debugging Method
Application:
12/827,673 →
Publication:
US 2010/0332213
Semiconductor Integrated Circuit Device and Method for Testing the Same
Application:
12/827,974 →
Publication:
US 2011/0001509
Exposure Device, Exposure Method, and Method for Manufacturing Semiconductor Device
Interposer Chip and Manufacturing Method Thereof
Method of Designing Semiconductor Device and Method of Manufacturing the Same
Related Assignments
(18)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 27, 2010
From: UCHIDA, SHINICHI; KAWASHIMA, YOSHITSUGU; ISE, HIROSHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024498/0803 →
Assignment of Assignor's Interest
May 27, 2010
From: UCHIDA, SHINICHI; KAWASHIMA, YOSHITSUGU; ISE, HIROSHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024498/0708 →
Assignment of Assignor's Interest
May 27, 2010
From: KANDA, TSUYOSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024498/0812 →
Assignment of Assignor's Interest
May 28, 2010
From: UCHINO, TATSUYA; SAITOU, HIROMI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024513/0485 →
Assignment of Assignor's Interest
May 28, 2010
From: WAKITA, RIKA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024513/0013 →
Assignment of Assignor's Interest
Jun 2, 2010
From: YAMAGUCHI, MICHIMASA; KAWAKAMI, KENICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024513/0519 →
Assignment of Assignor's Interest
Jun 2, 2010
From: EGAWA, HIDENORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024527/0448 →
Assignment of Assignor's Interest
Jun 4, 2010
From: BEKKU, FUMIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024526/0962 →
Assignment of Assignor's Interest
Jun 4, 2010
From: KONISHI, SHINYA; ARAI, NORIO; OHNISHI, OSAMU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024527/0275 →
Assignment of Assignor's Interest
Jun 8, 2010
From: ASHIZAWA, TETSUO; HONMA, HIROMI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024549/0083 →
Assignment of Assignor's Interest
Jun 8, 2010
From: ISHIZAKI, TATSUYA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024549/0109 →
Assignment of Assignor's Interest
Jun 8, 2010
From: KOI, TOMOAKI; WATANABE, ISAO; MATSUMOTO, TAKASHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024549/0112 →
Assignment of Assignor's Interest
Jun 9, 2010
From: TAKAHASHI, NOBUAKI; KOMURO, MASAHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024549/0621 →
Assignment of Assignor's Interest
Jun 9, 2010
From: HIRAI, KOJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024549/0648 →
Assignment of Assignor's Interest
Jun 10, 2010
From: WATANABE, KAZUO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024558/0421 →
Assignment of Assignor's Interest
Jun 17, 2010
From: NAKANO, FUMIO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024607/0797 →
Assignment of Assignor's Interest
Sep 1, 2010
From: HONMA, HIROMI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024932/0860 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →