Patent Assignment
Reel/Frame 024574/0947
Assignment of Assignor's Interest
Recorded: 2010-06-22
Pages: 4
Assignors
SAWA, NOBUHIRO
Executed: 2010-03-31
MINAMI, KOUICHI
Executed: 2010-03-31
CHIBA, MASATO
Executed: 2010-03-31
Assignees
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
KABUSHIKI KAISHA NIHON MICRONICS
6-8, KICHIJOJIHONCHO 2-CHOME, MUSASHINO-SHI, TOKYO, 180-0004, JAPAN
Covered Property
(1)
Test Apparatus of Semiconductor Device and Method Thereof
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.