IP Library › Assignment 024575/0382
Patent Assignment
Reel/Frame 024575/0382

Assignment of Assignor's Interest

Recorded: 2010-06-22 Pages: 3
Assignors
FEUSTEL, FRANK
Executed: 2010-05-20
LETZ, TOBIAS
Executed: 2010-05-20
KOSCHINSKY, FRANK
Executed: 2010-05-20
Assignee
GLOBALFOUNDRIES INC.
PO BOX 309, UGLAND HOUSE, GRAND CAYMAN, KY1-1194, CAYMAN ISLANDS
Covered Property (1)
Test System and Method of Reducing Damage in Seed Layers in Metallization Systems of Semiconductor Devices
Patent: 8,323,989 →
Application: 12/749,805 →
Publication: US 2010/0244028
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 27, 2019
From: GLOBALFOUNDRIES INC.
To: ALSEPHINA INNOVATIONS INC.
Reel/Frame 049612/0211 →
Release of Security Interest Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →