Patent Assignment
Reel/Frame 024726/0857
Assignment of Assignor's Interest
Recorded: 2010-07-22
Pages: 3
Assignor
KUDOU, KAZUYA
Executed: 2010-07-09
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Memory Test Circuit, Semiconductor Integrated Circuit and Memory Test Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.