Patent Assignment
Reel/Frame 025813/0759
Change of Name
Recorded: 2010-10-26
Pages: 8
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(45)
Semiconductor Memory Device with Improved Cell Arrangement
Patent:
4,855,956 →
Application:
07/103,312 →
Fault Location Estimation System, Fault Location Estimation Method, and Fault Location Estimation Program for Multiple Faults in Logic Circuit
Methods and Devices for Tracing Fiber Optic Cable
Conduction switching circuit, conduction switching circuit block, and operating method of conduction switching circuit
Application:
12/656,784 →
Publication:
US 2010/0207679
Apparatus and method for improving a golf shot
Application:
12/658,515 →
Publication:
US 2010/0160058
TCP-type semiconductor device
Application:
12/659,272 →
Publication:
US 2010/0224874
Operational Amplifier, Driver and Display
Hybrid Planarfet and Finfet Provided on a Chip
Output Circuit Using Analog Amplifier
Display panel driver
Semiconductor package, lead frame, and wiring board with the same
Application:
12/662,811 →
Publication:
US 2010/0290202
Terminal Device, Terminal Device Control Method, and Storage Medium
Tape carrier package, individual tape carrier package product, and method of manufacturing the same
Application:
12/801,061 →
Publication:
US 2010/0295045
Lcd Driving Circuit Using Operational Amplifier and Lcd Display Apparatus Using the Same
A Memory Embedded Logic Semiconductor Device Having Memory Region and Logic Circuit Region
Method of Designing Semiconductor Device Including Adjusting for Gate Antenna Violation
Semiconductor Device and Method for Manufacturing the Same
Method of Forming Side Wall Spacers for a Semiconductor Device
Semiconductor Integrated Circuit Test Device
Application:
12/838,967 →
Publication:
US 2011/0025360
Voltage Reducing Circuit
Level Shift Output Circuit and Plasma Display Apparatus Using the Same
Application:
12/839,814 →
Publication:
US 2011/0037745
Pixel Circuit and Display Device
Application:
12/839,831 →
Publication:
US 2011/0050761
Memory Test Circuit, Semiconductor Integrated Circuit and Memory Test Method
Semiconductor Integrated Circuit and Layout Method Thereof
Application:
12/841,428 →
Publication:
US 2011/0025378
Voltage Variation Reducing Circuit and Semiconductor Device Using the Same
Application:
12/842,293 →
Publication:
US 2011/0032028
Serial Communication Device with Mac That Conforms to Serial Media Independent Interface (Smii) in Order to Reduce Power Consumption
Temperature Detection Circuit
Semiconductor Device Analyzer and Semiconductor Device Analysis Method
Application:
12/842,664 →
Publication:
US 2011/0025340
Semiconductor Memory Device and Method of Manufacturing Semiconductor Memory Device
Semiconductor Device
Nonvolatile Semiconductor Memory Device and Method of Manufacturing the Same
Application:
12/844,421 →
Publication:
US 2011/0049609
Successive Approximation Type Ad Converter and Test Method Thereof
Semiconductor Integrated Circuit, Semiconductor Storage Device and Impedance Adjustment Method
Semiconductor Device Using Charge Pump Circuit
Level Shift Circuit, and Driver and Display Device Using the Same
Operational Amplifier and Semiconductor Device Using the Same
Application:
12/847,664 →
Publication:
US 2011/0025655
Jitter Calculating Device, Jitter Calculating Method and Jitter Calculating Program
Semiconductor Integrated Circuit and Method of Testing Circuit
Split Gate Nonvolatile Semiconductor Storage Device and Method of Manufacturing Split Gate Nonvolatile Semiconductor Storage Device
Application:
12/848,488 →
Publication:
US 2011/0049605
Ccd Image Sensor
Semiconductor Device and Method of Manufacturing the Same
Ink Set and Image Forming Method
Semiconductor Device Having Dual Work Function Metal
Application:
61/297,141 →
Semiconductor Device Including Porous Layer Covered by Poreseal Layer
Application:
61/305,454 →
Semiconductor Device and Method of Manufacturing the Same
Application:
61/305,457 →
Related Assignments
(19)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 27, 2006
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 018679/0062 →
Assignment of Assignor's Interest
Oct 4, 2007
From: FUNATSU, YUKIHISA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 019917/0792 →
Assignment of Assignor's Interest
Apr 19, 2010
From: NISHIMURA, KOUICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024284/0825 →
Assignment of Assignor's Interest
Apr 28, 2010
From: OKASHITA, TOMONORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024331/0876 →
Assignment of Assignor's Interest
Apr 30, 2010
From: SASAKI, SUGURU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024334/0796 →
Assignment of Assignor's Interest
Jun 10, 2010
From: IWAMOTO, TOSHIYUKI; TSUTSUI, GEN
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024534/0393 →
Assignment of Assignor's Interest
Jun 16, 2010
From: NACHI, KAZUMA; YAMADA, SHINICHI
To: NEC CORPORATION; NEC ELECTRONICS CORPORATION
Reel/Frame 024544/0985 →
Assignment of Assignor's Interest
Jun 17, 2010
From: NISHIMURA, KOUICHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024571/0126 →
Assignment of Assignor's Interest
Jun 17, 2010
From: NISHIMURA, KOUICHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024571/0123 →
Assignment of Assignor's Interest
Jun 18, 2010
From: NISHIMURA, KOUICHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024585/0175 →
Assignment of Assignor's Interest
Jul 15, 2010
From: NISHIMURA, KOUICHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024692/0027 →
Assignment of Assignor's Interest
Jul 15, 2010
From: SASAKI, HIDEKI; NISHIKAWA, KENJI; MORIOKA, MUNEHARU
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024704/0217 →
Assignment of Assignor's Interest
Jul 15, 2010
From: AOKI, YASUYUKI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024691/0928 →
Assignment of Assignor's Interest
Jul 16, 2010
From: KOBAYASHI, NAOHIRO
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024698/0605 →
Assignment of Assignor's Interest
Jul 16, 2010
From: ODA, NORIAKI; CHIKAKI, SHINICHI
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024698/0714 →
Assignment of Assignor's Interest
Jul 19, 2010
From: MITSUIKI, AKIRA; INADA, ATSURO
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024705/0026 →
Assignment of Assignor's Interest
Jul 22, 2010
From: YOSHINO, ISAO
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024737/0921 →
Assignment of Assignor's Interest
Mar 14, 2011
From: NAIDU, SHERSRIN; KAAIHUE, GENE
To: BELLSOUTH INTELLECTUAL PROPERTY CORPORATION
Reel/Frame 025949/0785 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →