Assignment of Assignor's Interest

Recorded: 2011-03-04 Pages: 4

Assignors

KIM, DAE-SUK

Executed: 2011-02-28

LEE, JONG-CHERN

Executed: 2011-02-28

KIM, CHUL

Executed: 2011-02-28

Assignee

HYNIX SEMICONDUCTOR INC.

SAN 136-1, AMI-RI, BUBAL-EUP, ICHEON-SI,, GYEONGGI-DO,, 467-701, KOREA, REPUBLIC OF

Covered Property (1)

Integrated Circuit for Detecting Defects of Through Chip Via

Patent: 8,946,869 →

Application: 13/041,003 →

Publication: US 2012/0153280

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.