Patent Assignment
Reel/Frame 034673/0442
Change of Name
Recorded: 2014-12-18
Pages: 48
Assignor
HYNIX SEMICONDUCTOR INC.
Executed: 2012-03-23
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Integrated Circuit for Detecting Defects of Through Chip Via
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.