Patent Assignment
Reel/Frame 026319/0730
CHANGE OF NAME
Recorded: 2011-05-20
Received: 2011-05-20
Pages: 5
Assignor
CYPRESS SEMICONDUCTOR CORPORATION (BELGIUM) BVBA
Executed: 2011-04-14
Assignee
ON SEMICONDUCTOR IMAGE SENSOR
SCHATIENHOEVEDREEF NO. 20 B, MECHELEN, BEX, 2800, BELGIUM
Covered Applications
(9)
TIME DELAYED INTEGRATION CMOS IMAGE SENSOR WITH ZERO DESYNCHRONIZATION
App. No. 11/540,527
→
BURIED, FULLY DEPLETABLE, HIGH FILL FACTOR PHOTODIODES
App. No. 10/984,485
→
SEMICONDUCTOR PIXEL ARRAYS WITH REDUCED SENSITIVITY TO DEFECTS
App. No. 10/655,248
→
RADIATION RESISTANT SEMICONDUCTOR DEVICE STRUCTURE
App. No. 10/233,894
→
FOUR-COMPONENT PIXEL STRUCTURE LEADING TO IMPROVED IMAGE QUALITY
App. No. 10/187,479
→
MULTIPLE OR GRADED EPITAXIAL WAFERS FOR PARTICLE OR RADIATION DETECTION
App. No. 10/056,573
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METHOD TO INCREASE CONVERSION GAIN OF AN ACTIVE PIXEL, AND CORRESPONDING ACTIVE PIXEL
App. No. 09/993,821
→
METHODS AND DEVICES FOR READING OUT AN IMAGE SENSOR WITH REDUCED DELAY TIME BETWEEN LINES
App. No. 09/906,405
→
METHOD TO ADJUST THE SIGNAL LEVEL OF AN ACTIVE PIXEL AND CORRESPONDING ACTIVE PIXEL
App. No. 09/906,418
→