IP Library Granted Patent US 7,224,389
Granted Patent B2
US 7,224,389 · App. 09/906,418 · Granted May 29, 2007

Method to adjust the signal level of an active pixel and corresponding active pixel

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Quick Facts
Patent No.
US 7,224,389
App. No.
09/906,418
Granted
May 29, 2007
Kind
B2
Abstract

An active pixel comprises a sensor circuit for collecting radiation induced charges and transducing them to a measurement signal corresponding to the amount of charge collected, and a capacitor element with two nodes, where the measurement signal is present on a node of the capacitor element. The memory circuit is clocked, i.e. driven by a pulsed signal. The pulse on the memory circuit will rise the reset level at the output, which is lowered due to threshold voltage losses in the active pixel circuit, thus restoring a large signal swing. Arrays of the pixels are described, as well as a method for reading out such a pixel.

Claims (34)

1. An active pixel comprising:

a sensor circuit for collecting radiation induced charges and for transducing them to a measurement signal corresponding to the amount of charge collected; and

a capacitor element with two nodes, where the measurement signal is present on a node of the capacitor element, where the measurement signal is changed to a shifted analog signal by changing the voltage on the other node of the capacitor element, and where the shifted analog signal is an output signal.

2. An active pixel according to claim 1 , where the measurement signal is stored on a node of the capacitor element.

3. An active pixel according to claim 2 , where the capacitor element is part of a sample and hold stage.

4. An active pixel according to claim 1 , furthermore comprising a pre-charge circuit to pre-charge the voltage on the node of the capacitor element.

5. An active pixel according to claim 1 , furthermore comprising a read-out circuit connected to the capacitor element, for reading out the shifted analog signal present on the node of the capacitor element.

6. An active pixel according to claim 1 , furthermore comprising a buffer/multiplexer for reading out the signal present on the node of the capacitor element.

7. An active pixel according to claim 1 , wherein the sensor circuit comprises a series connection of a reverse-biased photodiode and a reset transistor.

8. An active pixel according to claim 1 , wherein a first buffer is provided between the capacitor element and the read-out circuit.

9. An active pixel according to claim 1 , wherein a second buffer is provided between the sensor circuit and a sample circuit.

10. A method for reading out a signal representing a quantity of radiation incident on an active pixel comprising a semiconductor substrate and a read out circuit, the method comprising the steps of:

receiving radiation on the substrate, collecting charges on the substrate generated by the radiation and transducing them to a measurement signal; and

transferring the measurement signal present on a first node of a capacitor element to the read-out circuit, the method further comprising the step of, before the measurement signal appears on the first node of the capacitor element, applying a low voltage pulse to a second node of the capacitor element, and after the appearance of the measurement signal on the first node but before reading it out, raising the voltage applied to the second node of the capacitor element so as to shift the measurement signal to a shifted analog signal and to read out the shifted analog signal.

11. A method according to claim 10 , whereby the step of transferring includes storing the measurement signal on a first node of the capacitor element.

12. A method according to claim 10 , comprising furthermore a step of pre-charging the capacitor element before transferring or storing the measurement signal.

13. A method according to claim 10 , wherein a reset level of the pixel is stored, and the moment of readout, this stored reset level and an actual signal level are output briefly after each other, so as to allow subsequent correlated double sampling.

14. An array of active pixels, each active pixel comprising:

a sensor circuit for collecting radiation induced charges and for transducing them to a measurement signal corresponding to the amount of charge collected; and

a capacitor element with two nodes where the measurement signal is present on a node of the capacitor element, where the signal level is changed to a shifted analog signal level by changing the voltage on the other node of the capacitor element, and where the shifted analog signal is an output signal.

15. An array according to claim 14 , where the measurement signal is stored on a node of the capacitor element.

16. An array according to claim 15 , where the capacitor element is part of a sample and hold stage.

17. An array according to claim 14 , wherein each active pixel furthermore comprises a pre-charge circuit to pre-charge the voltage on the capacitor element.

18. An array according to claim 14 , wherein each active pixel furthermore comprises a read-out circuit connected to the capacitor element, for reading out the shifted analog signal present on the node of the capacitor element.

19. An array according to claim 14 , wherein each active pixel furthermore comprises a buffer/multiplexer for reading out the signal present on the memory element.

20. An array according to claim 14 , wherein the sensor circuit of each active pixel comprises a series connection of a reverse-biased photodiode and a reset transistor.

21. An array according to claim 14 , wherein a first buffer is provided between the capacitor element and the read-out circuit of each active pixel.

22. An array according to claim 14 , wherein a second buffer is provided between the sensor circuit and a sample circuit of each active pixel.

23. A method for reading out a signal representing a quantity of radiation incident on active pixels of an array, each pixel comprises a semiconductor substrate having a capacitor element, the method comprising the steps of:

receiving radiation on the substrate;

collecting charges at different active pixels on the substrate generated by the radiation and transducing them to measurement signals;

driving the capacitor elements by a pulsed signal thus shifting the measurement signals to shifted analog signals; and

storing the measurement signals on the capacitor elements, further comprising the step of driving different capacitor elements by a pulsed signal at the same time.

24. A method according to claim 23 , the method further comprising a step of precharging the capacitors of all the active pixels of the array at the same time.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2012
From: ON SEMICONDUCTOR IMAGE SENSOR BVBA
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 028598/0477 →
CHANGE OF NAME Recorded May 20, 2011
From: CYPRESS SEMICONDUCTOR CORPORATION (BELGIUM) BVBA
To: ON SEMICONDUCTOR IMAGE SENSOR
Reel/Frame 026319/0730 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 17, 2005
From: FILLFACTORY N.V.
To: CYPRESS SEMICONDUCTOR CORPORATION (BELGIUM) BVBA
Reel/Frame 017094/0208 →
CHANGE OF NAME Recorded Jan 9, 2002
From: DIERICKX, BART
To: FILLFACTORY
Reel/Frame 012452/0130 →