IP Library Granted Patent US 7,675,561
Granted Patent B2
US 7,675,561 · App. 11/540,527 · Granted Mar 9, 2010

Time delayed integration CMOS image sensor with zero desynchronization

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Quick Facts
Patent No.
US 7,675,561
App. No.
11/540,527
Granted
Mar 9, 2010
Kind
B2
Abstract

A time delayed integration image sensor provides over-sampled image data on a time-shared column bus to maintain data synchronization.

Claims (28)

1. A method, comprising:

sampling an image that is moving with respect to an imaging away to acquire a plurality of image samples in a plurality of time periods, wherein a ratio of the plurality of image samples to the plurality of time periods comprises an over-sampling ratio, and wherein each image sample is acquired at a different time than any other image sample is acquired;

sequentially reading the plurality of image samples in a rotating line sequence of the imaging array, wherein each of the image samples is read at a different time than any other image sample is read; and

sequentially storing the plurality of image samples in a plurality of addition stages in the rotating line sequence of the imaging array, wherein a ratio of the plurality of addition stages to the plurality of time periods comprises the over-sampling ratio, wherein the image comprises a plurality of image points, and wherein multiple samples of an image point are integrated in a single addition stage.

2. The method of claim 1 , wherein sampling the image comprises acquiring samples of the image with n photosensitive elements comprising n lines of the imaging array, wherein a point in the moving image transits the n photosensitive elements in n line times, wherein the n photosensitive elements acquire n+1 samples of the point in the moving image in the n line times, wherein the n photosensitive elements acquire n+1 samples of the moving image during each line time, wherein each photosensitive element acquires n+1 samples of the moving image during the n line times, and wherein the n photosensitive elements acquire samples of the moving image at different times during each line time.

3. The method of claim 1 , wherein sequentially reading the plurality of image samples comprises reading n+1 image samples in the rotating line sequence of the imaging away from the n photosensitive elements during n successive line times, wherein no two photosensitive elements are read at the same time during each line time.

4. The method of claim 1 , wherein sequentially storing the plurality of image samples comprises storing the n+1 image samples in the rotating line sequence of the imaging away in n+1 corresponding addition stages, wherein image samples of a point in the moving image are added n times in one of the n+1 addition stages.

5. The method of claim 1 , wherein sequentially storing the plurality of image samples comprises storing the n+1 image samples in the rotating line sequence of the imaging away in n+2 corresponding addition stages, wherein image samples of a point in the moving image are added n times in one of the n+2 addition stages.

6. The method of claim 5 , wherein one of the n+2 addition stages is calibrated during each line time.

7. The method of claim 2 , wherein each sample of the image comprises a rest level and a signal level.

8. The method of claim 3 , wherein sequentially reading the plurality of image samples comprises reading a reset level and a signal level from each of the photosensitive elements in the rotating line sequence of the imaging array.

9. The method of claim 4 , wherein sequentially storing the plurality of image samples comprises:

storing a reset level of an imaging pixel;

subtracting a signal level of the imaging pixel from the reset level of the imaging pixel to obtain a difference signal; and

storing the difference signal.

10. An apparatus, comprising:

a plurality of photosensitive elements in an imaging away selectively connected to a column bus, wherein each photosensitive element is configured to acquire a plurality of image samples of an image that is moving with respect to the imaging array in a plurality of time periods, wherein a ratio of the plurality of image samples to the plurality of time periods comprises an over-sampling ratio, and wherein each image sample is acquired at a different time than any other image sample is acquired;

a plurality of time delay integration (TDI) stages selectively coupled to the column bus, wherein the plurality of TDI stages is configured to sequentially read the plurality of image samples in a rotating line sequence of the imaging array and to read each image sample at a different time than any other image sample is read, the plurality of TDI stages comprising a plurality of addition circuits to sequentially store the plurality of image samples in the rotating line sequence of the imaging array, wherein a ratio of the plurality of TDI stages to the plurality of time periods comprises the over-sampling ratio, wherein the image comprises a plurality of image points, and wherein each addition circuit is configured to add multiple samples of an image point.

11. The apparatus of claim 10 , wherein the imaging away comprises n active pixels comprising n lines of the imaging array, wherein a point in the moving image transits the imaging away in n line times, wherein the n active pixels are configured to acquire n+1 samples of the point in the moving image in the n line times and to acquire n+1 samples of the moving image during each line time, wherein each active pixel is configured to acquire n+1 samples of the moving image during the n line times and to acquire samples of the moving image at different times during each line time.

12. The apparatus of claim 11 , wherein the plurality of TDI stages comprises n+1 TDI stages and wherein to sequentially read the plurality of image samples, the n+1 TDI stages are configured to read n+1 image samples in the rotating line sequence of the imaging away from the n active pixels during the n line times, wherein no two active pixels are read at the same time during each line time.

13. The apparatus of claim 12 , wherein the n+1 TDI stages comprise n+1 addition circuits, wherein to sequentially store the plurality of image samples, each of the n+1 addition circuits is configured to add n samples of an image point.

14. The apparatus of claim 11 , wherein the plurality of ill! stages comprises n+2 TDI stages and wherein to sequentially read the plurality of image samples, the n+2 TDI stages are configured to read n+1 image samples in the rotating line sequence of the imaging away from the n active pixels during the n line times, wherein no two active pixels are read at the same time during each line time.

15. The apparatus of claim 14 , wherein each TDI stage comprises calibration circuitry configured to calibrate one of the n+2 TDI stages during each line time.

16. The apparatus of claim 10 , wherein each image sample comprises a pixel reset level and a pixel signal level, wherein each TDI stage comprises a correlated double sampling circuit configured to store a difference signal comprising a difference between the pixel reset level and the pixel signal level.

17. A system, comprising:

an area array of photosensitive elements configured to generate spatially and temporally over-sampled image data of an image in motion with respect to the array, the away comprising a width of m photosensitive elements in a crosstrack dimension and a length of n lines of photosensitive elements in an alongtrack dimension, wherein points in the image transit the n lines in n line times, and wherein each photosensitive element in a line samples image data at a different time than any other photosensitive element in the line; and

a time delayed integration (TDI) stage array coupled with the area away to sequentially read and store the spatially and temporally over-sampled image data, the TDI stage array comprising a width of m TDI stages and a length of at least n+1 TDI stages, wherein n+1 copies of each image point are added during the n line times to obtain an output value of each image point.

18. The system of claim 17 , further comprising an m to 1 multiplexer to sequentially read m TDI stages containing an output value of m different image points.

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2012
From: ON SEMICONDUCTOR IMAGE SENSOR BVBA
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 028598/0477 →
CHANGE OF NAME Recorded May 20, 2011
From: CYPRESS SEMICONDUCTOR CORPORATION (BELGIUM) BVBA
To: ON SEMICONDUCTOR IMAGE SENSOR
Reel/Frame 026319/0730 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2006
From: LEPAGE, GERALD
To: CYPRESS SEMICONDUCTOR CORPORATION (BELGIUM) BVBA
Reel/Frame 018551/0920 →