IP Library Assignment 026584/0700
Patent Assignment
Reel/Frame 026584/0700

Assignment of Assignor's Interest

Recorded: 2011-07-13 Pages: 3
Assignors
YUN, TAE SIK
Executed: 2011-07-08
LEE, JONG CHERN
Executed: 2011-07-08
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SI, 467-860, KOREA, REPUBLIC OF
Covered Property (1)
Test Mode Control Circuit of Semiconductor Apparatus and Control Method Thereof
Patent: 9,360,520 →
Application: 13/181,921 →
Publication: US 2012/0119764
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Apr 1, 2016
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 038325/0224 →