Patent Assignment
Reel/Frame 038325/0224
Change of Name
Recorded: 2016-04-01
Pages: 48
Assignor
HYNIX SEMICONDUCTOR INC.
Executed: 2012-03-23
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Test Mode Control Circuit of Semiconductor Apparatus and Control Method Thereof
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.