IP Library › Assignment 026886/0896
Patent Assignment
Reel/Frame 026886/0896

Assignment of Assignor's Interest

Recorded: 2011-09-12 Pages: 5
Assignors
YAMANE, TAKESHI
Executed: 2011-09-07
TERASAWA, TSUNEO
Executed: 2011-09-06
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property (1)
Mask Defect Inspection Method and Defect Inspection Apparatus
Patent: 8,699,783 →
Application: 13/230,030 →
Publication: US 2012/0063667
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 11, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 050339/0573 →
Merger and Change of Name Sep 13, 2019
From: TOSHIBA MEMORY CORPORATION; K. K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 050494/0645 →
Change of Name and Address Apr 20, 2020
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 052436/0702 →