Patent Assignment
Reel/Frame 052436/0702
Change of Name and Address
Recorded: 2020-04-20
Pages: 98
Assignor
TOSHIBA MEMORY CORPORATION
Executed: 2019-10-01
Assignee
KIOXIA CORPORATION
1-21, SHIBAURA 3-CHOME, MINATO-KU,, TOKYO,, JAPAN
Covered Properties
(25)
Semiconductor Device with a Binary Alloy Bonding Layer
Semiconductor Device and Method of Manufacturing the Same
A Semiconductor Wafer and Method of Manufacturing a Semiconductor Device Using a Separation Portion on a Peripheral Area of the Semiconductor Wafer
Three-Dimensionally Mounted Semiconductor Module and Three-Dimensionally Mounted Semiconductor System
Method of Generating Writing Pattern Data of Mask and Method of Writing Mask
Semiconductor Wafer Having a Separation Portion on a Peripheral Area
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Device with a Sige Layer Having Uniaxial Lattice Strain
Element Fabrication Substrate
Semiconductor Device and Manufacturing Method Thereof
Spin Mos Field Effect Transistor and Tunneling Magnetoresistive Effect Element Using Stack Having Heusler Alloy
Reflective-Type Mask
Manufacturing Method of Semiconductor Device and Manufacturing Method of Mask
Spin Mos Field Effect Transistor and Tunneling Magnetoresistive Effect Element Using Stack Having Heusler Alloy
Reflection-Type Exposure Mask and Method of Manufacturing a Semiconductor Device
Mask Defect Measurement Method, Mask Quality Determination Method, and Manufacturing Method of Semiconductor Device
Semiconductor Device and Method of Manufacturing the Same
Reflective Exposure Mask, Method of Fabricating Reflective Exposure Mask, Method of Inspecting Reflective Exposure Mask, and Method of Cleaning Reflective Exposure Mask
Semiconductor Device and Manufacturing Method Thereof
Mask Defect Inspection Method and Defect Inspection Apparatus
Semiconductor Device and Method of Manufacturing the Same
Method of Manufacturing Semiconductor Device Having Pre-Silicide Nitrogen Implant
Mask Inspection Method and Mask Inspection Apparatus
Semiconductor Device and Method of Manufacturing the Same
Method of Correcting Defects in a Reflection-Type Mask and Mask-Defect Correction Apparatus
Related Assignments
(13)
Other recorded transfers of the patents in this record — the chain of ownership.
Merger
Sep 1, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRRONICS CORPORATION
Reel/Frame 024933/0869 →
Change of Name
Sep 1, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024953/0404 →
Corrective Assignment to Correct the Assignees Previously Recorded on Reel 012670 Frame 0806. Assignor(S) Hereby Confirms the Assignees.
Mar 27, 2014
From: TAGO, MASAMOTO; TOMITA, YOSHIHIRO; TAKAHASHI, KENJI
To: NEC CORPORATION; MITSUBISHI DENKI KABUSHIKI KAISHA; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 032537/0677 →
Merger
Mar 31, 2014
From: RENESAS TECHNOLOGY CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 032568/0589 →
Change of Name
Apr 7, 2014
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 032613/0379 →
Assignment of Assignor's Interest
Apr 22, 2014
From: NEC CORPORATION; RENESAS ELECTRONICS CORPORATION; KABUSHIKI KAISHA TOSHIBA
To: RENESAS ELECTRONICS CORPORATION; KABUSHIKI KAISHA TOSHIBA
Reel/Frame 032724/0541 →
Merger and Change of Name
May 23, 2014
From: RENESAS TECHNOLOGY CORP.; NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 032954/0181 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
Merger
Aug 20, 2019
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 050095/0092 →
Split and General Succession
Aug 20, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 050095/0076 →
Change of Name and Address
Aug 20, 2019
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 050095/0097 →
Assignment of Assignor's Interest
Sep 11, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 050339/0573 →
Merger and Change of Name
Sep 13, 2019
From: TOSHIBA MEMORY CORPORATION; K. K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 050494/0645 →