Patent Assignment
Reel/Frame 027438/0344
Corrective Assignment to Correct the Application Number: 13045063 Previously Recorded on Reel 026532 Frame 0979. Assignor(S) Hereby Confirms the Application Number: 13046063.
Recorded: 2011-12-22
Pages: 6
Assignor
DIETZ, CHRISTOPH
Executed: 2011-04-11
Assignee
PRECITEC OPTRONIK GMBH
RAIFFEISENSTR. 5, RODGAU, 63110, GERMANY
Covered Property
(1)
Apparatus and Method for Monitoring a Thickness of a Silicon Wafer with a Highly Doped Layer
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 30, 2011
From: SCHOENLEBAR, MARTIN
To: PRECITEC OPTRONIK GMBH
Reel/Frame 026532/0686 →
Assignment of Assignor's Interest
Jun 30, 2011
From: DIETZ, CHRISTOPH
To: PRECITEC OPTRONIK GMBH
Reel/Frame 026532/0979 →
Corrective Assignment to Correct the Conveying Party: Martin Schoenlebar Previously Recorded on Reel 026532 Frame 0686. Assignor(S) Hereby Confirms the Conveying Party: Martin Schoenleber.
Dec 22, 2011
From: SCHOENLEBER, MARTIN
To: PRECITEC OPTRONIK GMBH
Reel/Frame 027438/0335 →
Change of Address for Assignee
Jan 28, 2014
From: PRECITEC OPTRONIK GMBH
To: PRECITEC OPTRONIK GMBH
Reel/Frame 032132/0344 →