IP Library › Assignment 032132/0344
Patent Assignment
Reel/Frame 032132/0344

Change of Address for Assignee

Recorded: 2014-01-28 Pages: 2
Assignor
PRECITEC OPTRONIK GMBH
Executed: 2014-01-28
Assignee
PRECITEC OPTRONIK GMBH
SCHLEUSSNERSTRASSE 54, NEU-ISENBURG, 63263, GERMANY
Covered Property (1)
Apparatus and Method for Monitoring a Thickness of a Silicon Wafer with a Highly Doped Layer
Patent: 8,699,038 →
Application: 13/046,063 →
Publication: US 2011/0261371
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 30, 2011
From: SCHOENLEBAR, MARTIN
To: PRECITEC OPTRONIK GMBH
Reel/Frame 026532/0686 →
Assignment of Assignor's Interest Jun 30, 2011
From: DIETZ, CHRISTOPH
To: PRECITEC OPTRONIK GMBH
Reel/Frame 026532/0979 →
Corrective Assignment to Correct the Conveying Party: Martin Schoenlebar Previously Recorded on Reel 026532 Frame 0686. Assignor(S) Hereby Confirms the Conveying Party: Martin Schoenleber. Dec 22, 2011
From: SCHOENLEBER, MARTIN
To: PRECITEC OPTRONIK GMBH
Reel/Frame 027438/0335 →
Corrective Assignment to Correct the Application Number: 13045063 Previously Recorded on Reel 026532 Frame 0979. Assignor(S) Hereby Confirms the Application Number: 13046063. Dec 22, 2011
From: DIETZ, CHRISTOPH
To: PRECITEC OPTRONIK GMBH
Reel/Frame 027438/0344 →