IP Library Assignment 027452/0666
Patent Assignment
Reel/Frame 027452/0666

Assignment of Assignor's Interest

Recorded: 2011-12-28 Pages: 2
Assignor
LEU, IYUN
Executed: 2011-12-22
Assignee
ELITETECH TECHNOLOGY CO.,LTD.
1F., NO. 27, LANE 228, MINGXING RD., ZHUDONG TOWN, HSINCHU COUNTY, 31055, TAIWAN
Covered Property (1)
Method for Building Rule of Thumb of Defect Classification, and Methods for Classifying Defect and Judging Killer Defect Based on Rule of Thumb and Critical Area Analysis
Patent: 8,908,957 →
Application: 13/338,672 →
Publication: US 2013/0170733
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 6, 2017
From: ELITETECH TECHNOLOGY CO.,LTD.
To: ELITE SEMICONDUCTOR, INC.
Reel/Frame 041304/0150 →