Patent Assignment
Reel/Frame 041304/0150
Change of Name
Recorded: 2017-01-06
Pages: 3
Assignor
ELITETECH TECHNOLOGY CO.,LTD.
Executed: 2014-05-26
Assignee
ELITE SEMICONDUCTOR, INC.
1F., NO. 27, LANE 228, MINGXING RD., ZHUDONG TOWN, HSINCHU COUNTY, 31055, TAIWAN
Covered Property
(1)
Method for Building Rule of Thumb of Defect Classification, and Methods for Classifying Defect and Judging Killer Defect Based on Rule of Thumb and Critical Area Analysis
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.