Patent Assignment
Reel/Frame 027454/0523
Assignment of Assignor's Interest
Recorded: 2011-12-28
Pages: 3
Assignor
CHOI, YOUNG GEUN
Executed: 2011-12-20
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, ICHEON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Voltage Monitoring Test Circuit and Voltage Monitoring Method Using the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.