IP Library Assignment 039391/0294
Patent Assignment
Reel/Frame 039391/0294

Change of Name

Recorded: 2016-07-19 Pages: 49
Assignor
HYNIX SEMICONDUCTOR INC.
Executed: 2012-03-23
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property (1)
Voltage Monitoring Test Circuit and Voltage Monitoring Method Using the Same
Patent: 9,443,609 →
Application: 13/339,173 →
Publication: US 2013/0049736
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 28, 2011
From: CHOI, YOUNG GEUN
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 027454/0523 →