IP Library › Assignment 028150/0519
Patent Assignment
Reel/Frame 028150/0519

Assignment of Assignor's Interest

Recorded: 2012-05-03 Pages: 3
Assignors
KUAN, CHIYAN
Executed: 2012-04-26
WANG, YI-XIANG
Executed: 2012-04-26
PAN, CHUNG-SHIH
Executed: 2012-04-26
DONG, ZHONGHUA
Executed: 2012-04-26
CHEN, ZHONGWEI
Executed: 2012-04-26
Assignee
HERMES MICROVISION INC.
7F, NO.18, PUDING RD., EAST DIST., HSINCHU CITY, 300, TAIWAN
Covered Property (1)
Charged Particle System for Reticle / Wafer Defects Inspection and Review
Patent: 8,519,333 →
Application: 13/463,208 →
Publication: US 2012/0280125
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION, INC.
To: HERMES MICROVISION INCORPORATED B.V.
Reel/Frame 054866/0742 →
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION INCORPORATED B.V.
To: ASML NETHERLANDS B.V.
Reel/Frame 054870/0156 →