IP Library › Assignment 028857/0229
Patent Assignment
Reel/Frame 028857/0229

Assignment of Assignor's Interest

Recorded: 2012-08-28 Pages: 2
Assignors
NAKAO, TOSHIYUKI
Executed: 2012-06-20
MARUYAMA, SHIGENOBU
Executed: 2012-06-20
URANO, YUTA
Executed: 2012-06-20
HONDA, TOSHIFUMI
Executed: 2012-06-20
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Device and Defect Inspection Method
Patent: 9,041,921 →
Application: 13/519,138 →
Publication: US 2013/0003052
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →