Patent Assignment
Reel/Frame 029245/0687
Assignment of Assignor's Interest
Recorded: 2012-11-06
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method of Extracting Contour Lines of Image Data Obtained By Means of Charged Particle Beam Device, and Contour Line Extraction Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.