IP Library › Assignment 029559/0143
Patent Assignment
Reel/Frame 029559/0143

Assignment of Assignor's Interest

Recorded: 2013-01-03 Pages: 2
Assignors
TANIGUCHI, ATSUSHI
Executed: 2012-11-21
SHIBATA, YUKIHIRO
Executed: 2012-12-03
UENO, TAKETO
Executed: 2012-11-22
MATSUMOTO, SHUNICHI
Executed: 2012-12-04
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspecting Apparatus and Defect Inspecting Method
Patent: 8,830,465 →
Application: 13/700,150 →
Publication: US 2013/0188184
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →