IP Library Assignment 029581/0101
Patent Assignment
Reel/Frame 029581/0101

Assignment of Assignor's Interest

Recorded: 2013-01-07 Pages: 7
Assignors
WINTERS, DENNIS
Executed: 2012-12-20
COOTS, VICTOR
Executed: 2012-12-20
BURNHAM, MATTHEW
Executed: 2012-12-20
THEVIS, DANIEL
Executed: 2012-12-20
Assignees
SAMSUNG AUSTIN SEMICONDUCTOR, L.P.
12100 SAMSUNG BLVD, AUSTIN, TEXAS, 78754
SAMSUNG ELECTRONICS CO., LTD
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 443-742, KOREA, REPUBLIC OF
Covered Property (1)
Semiconductor Manufacturing Equipment with Trace Elements for Improved Defect Tracing and Methods of Manufacture
Patent: 9,385,018 →
Application: 13/735,866 →
Publication: US 2014/0190278
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Aug 31, 2018
From: SAMSUNG AUSTIN SEMICONDUCTOR, L.P.
To: SAMSUNG AUSTIN SEMICONDUCTOR, LLC
Reel/Frame 047006/0105 →