Change of Name

Recorded: 2013-03-11 Pages: 26

Assignor

HYNIX SEMICONDUCTOR INC.

Executed: 2012-03-23

Assignee

SK HYNIX INC.

2091 GYEONGCHUNGDAE-RO, BUBAL-EUP ICHEON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF

Covered Property (1)

Test Circuit for Use in a Semiconductor Apparatus

Patent: 8,786,302 →

Application: 13/159,178 →

Publication: US 2011/0233548

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.