Patent Assignment
Reel/Frame 030173/0807
Assignment of Assignor's Interest
Recorded: 2013-03-22
Pages: 3
Assignee
RENESAS ELECTRONICS CORPORATION
1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Scan Test Circuit, Test Pattern Generation Control Circuit, and Scan Test Control Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.