IP Library › Assignment 030192/0658
Patent Assignment
Reel/Frame 030192/0658

Assignment of Assignor's Interest

Recorded: 2013-04-11 Pages: 2
Assignor
SHIMURA, KEI
Executed: 2013-03-08
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property (1)
Defect Inspection Apparatus And Defect Inspection Method
Patent: 8,921,798 →
Application: 13/789,156 →
Publication: US 2014/0042332
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →