IP Library › Assignment 030509/0291
Patent Assignment
Reel/Frame 030509/0291

Assignment of Assignor's Interest

Recorded: 2013-05-30 Pages: 3
Assignors
MURAKAMI, SHINYA
Executed: 2013-05-13
SHISHIDO, CHIE
Executed: 2013-05-13
HIROI, TAKASHI
Executed: 2013-05-16
NINOMIYA, TAKU
Executed: 2013-05-17
MINAKAWA, TSUYOSHI
Executed: 2013-05-21
MIYAMOTO, ATSUSHI
Executed: 2013-05-13
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Defect Inspection Apparatus
Patent: 8,953,868 →
Application: 13/905,164 →
Publication: US 2013/0322737
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →