IP Library Assignment 030573/0211
Patent Assignment
Reel/Frame 030573/0211

Change of Address of Assignee

Recorded: 2013-06-06 Pages: 3
Assignor
HITACHI CHEMICAL COMPANY, LTD.
Executed: 2013-06-06
Assignee
HITACHI CHEMICAL COMPANY, LTD.
9-2, MARUNOUCHI 1-CHOME, CHIYODA-KU, TOKYO, 100-6606, JAPAN
Covered Property (1)
Cmp Abrasive Slurry for Polishing Insulation Film, Polishing Method, and Semiconductor Electronic Part Polished by the Polishing Method
Patent: 8,524,111 →
Application: 12/162,662 →
Publication: US 2009/0047786
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 30, 2008
From: FUKASAWA, MASATO; ENOMOTO, KAZUHIRO; YAMAGISHI, CHIAKI; KOYAMA, NAOYUKI
To: HITACHI CHEMICAL CO., LTD.
Reel/Frame 021314/0185 →
Change of Name Mar 2, 2023
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062917/0865 →
Change of Name Mar 3, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062946/0125 →
Change of Address Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →